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 ChipTest develops Handler for ATE
 Sep 05, 2014

ChipTest has indigenously developed an Automatic Test Handler for Semiconductor IC Testing applications. This is the first Automated Handler Equipment designed & built completely in ,, incorporating the latest technological features.

The Handler has been designed for high-speed production testing of high-end products requiring real plunge to board contact interface at both ambient & high temperatures up to 150C. The Handler is designed for a wide variety of packages including QFN, MLP, SOIC, SOJ with package sizes ranging from 3mm to 10mm. The User friendly touchscreen operations enable easy viewing of real-time Product Test information with useful menu screens for Handler operations & diagnostics. The Handler has the proven Poke Yoke options for maintaining the highest level of Quality requirements.

 This most economical solution for low volume production testing and bench-top applications that gives accelerated return on investment has been rigorously tested for long term stability & reliability. The Handler is commercially out in the market having successfully been installed in the US.


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