ChipTest
develops Handler for ATE |
Sep
05, 2014 |
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ChipTest has indigenously developed an Automatic Test
Handler for Semiconductor IC Testing applications. This
is the first Automated Handler Equipment designed &
built completely in ,, incorporating the latest
technological features.
The Handler has been designed for high-speed production
testing of high-end products requiring real plunge to
board contact interface at both ambient & high
temperatures up to 150°C.
The Handler is designed for a wide variety of packages
including QFN, MLP, SOIC, SOJ with package sizes ranging
from 3mm to 10mm. The User friendly touchscreen
operations enable easy viewing of real-time Product Test
information with useful menu screens for Handler
operations & diagnostics. The Handler has the proven
Poke Yoke options for maintaining the highest level of
Quality requirements.
This most economical solution for low volume production
testing and bench-top applications that gives
accelerated return on investment has been rigorously
tested for long term stability & reliability. The
Handler is commercially out in the market having
successfully been installed in the US.
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