Sl.No.

Placement

Description

1

Position

Dependent upon their experience designation will be give

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Job Description

Knowledged in ATE Test Program development, digital characterization test, design and debug of ATE test interface HW (loadboard), releasing cost effective production test solutions into mass production, and test time reduction activities for Digital and Mixed Signal tests.

Knowledged in automated test equipment (ATE) test solutions for design verification of highly integrated System on chips, High end digital,  RF receivers/transmitters/transceivers, power management (PMIC), analog and mixed signal ASICs

2 to 7 years of relevant experience in Teradyne FLEX/ Teradyne J750

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Educational Qualification

BE (ECE)

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Skills & Knowledge

Ø  Strong software skills for writing and debugging test code. Competency in programming with Perl and C/C++.

Ø  Experience working on Digital and Mixed Signal test programs for both final test and wafer probe. RF and PMIC test experience is a plus.

Ø  Hands on experience with Automated Test Equipment (ATE), preferably Teradyne FLEX/ Teradyne J750.

Ø  Knowledge of statistical analysis techniques, quality and reliability testing.

Ø  Good ASIC device level characterization skills. System level knowledge is a plus.

Ø  Able to work with common test equipment (oscilloscope, spectrum analyzer, time interval analyzer, logic analyzer, network analyzer, etc).

Ø  Able to work independently and with good initiative to overcome technical challenges.

Ø  Strong verbal and written communications skills with suppliers and customers.

Ø  Strong verbal and written communications skills with suppliers and customers.

Ø  Teradyne FLEX/ Teradyne J750   experience is preferred.

Ø  Depending on years of relevant experience, candidate may be considered for Senior level position.